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172.
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Last test result as microseconds to discharge cap, saturated at its maximum value. Also logs minutes since last test and lifetime number of tests. Raw value contains the following data: Bytes 0-1: Last test result as microseconds to discharge cap, saturates at max value. Test result expected in range 25 <= result <= 5000000, lower indicates specific error code. Bytes 2-3: Minutes since last test, saturates at max value. Bytes 4-5: Lifetime number of tests, not incremented on power cycle, saturates at max value. Normalized value is set to one on test failure or 11 if the capacitor has been tested in an excessive temperature condition, otherwise 100.
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(no translation yet)
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173.
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Erase Fail Count (chip). This parameter indicates a number of flash erase command failures.
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Liczba błędów kasowania (chip). Ten parametr wskazuje liczbę błędów poleceń kasowania flash.
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Translated and reviewed by
Tomasz Swidzinski
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174.
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Delta between most-worn and least-worn Flash blocks. It describes how good/bad the wearleveling of the SSD works on a more technical way.
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(no translation yet)
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175.
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Pre-Fail' Attribute used at least in Samsung devices.
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Atrybut 'Pre-Fail' używany w urządzeniach Samsunga.
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Translated and reviewed by
Tomasz Swidzinski
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176.
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Pre-Fail' Attribute used at least in HP devices.
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Atrybut 'Pre-Fail' używany w urządzeniach HP.
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Translated and reviewed by
Tomasz Swidzinski
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177.
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Total number of Flash program operation failures since the drive was deployed.
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Całkowita liczba niepowodzeń operacji flash od wdrożenia.
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Translated and reviewed by
Tomasz Swidzinski
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178.
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Western Digital, Samsung or Seagate attribute: Total number of data blocks with detected, uncorrectable errors encountered during normal operation.
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Atrybut Western Digital, Samsunga i Seagate'a. Całkowita liczba wykrytych bloków danych łącznie z nienaprawialnymi błędami wykrytymi podczas normalnej pracy.
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Translated by
zoon01
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179.
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This attribute is a part of Hewlett-Packard's SMART IV technology, as well as part of other vendors' IO Error Detection and Correction schemas, and it contains a count of parity errors which occur in the data path to the media via the drive's cache RAM.
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(no translation yet)
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180.
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Western Digital attribute.
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Parametr stosowany przez firmę Western Digital
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Translated by
zoon01
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181.
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The count of errors that could not be recovered using hardware ECC (see attribute 195).
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Ilość błedów które nie mogły zostać naprawione używając sprzętowej korekty ECC ( Patrz atrybut 195).
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Translated by
zoon01
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